Medias
Machine Learning Support for Fault Diagnosis of System-on-Chip
This book provides a state-of-the-art guide to Machine Learning (ML)-based techniques that have been shown to be highly efficient for diagnosis of failures in electronic circuits and systems. The methods discussed can be used for volume diagnosis after manufacturing or for diagnosis of customer returns. Readers will be enabled to deal with huge amount of insightful test data that cannot be exploited otherwise in an efficient, timely manner. After some background on fault diag
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Spécifications techniques
Date de sortie | 14 mars 2023 |
Langue | Anglais |
Éditeur | SPRINGER |
Accessibilité | Aucune information disponible concernant l'accessibilité pour le format ePub |